TY  - JOUR
AU  - Kruskopf, Mattias
AU  - Elmquist, Randolph
C2  - Metrologia
DA  - 2018-07-20 00:07:00
LA  - en
M1  - 55
PB  - Metrologia
PY  - 2018
TI  - Epitaxial graphene for quantum resistance metrology
ER  -