TY  - JOUR
AU  - Oe, Takehiko
AU  - Rigosi, Albert
AU  - Kruskopf, Mattias
AU  - Wu, Bi
AU  - Lee, Hsin
AU  - Yang, Yanfei
AU  - Elmquist, Randolph
AU  - Kaneko, Nobu-hisa
AU  - Jarrett, Dean
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2019-07-25 00:07:00
LA  - en
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2019
TI  - Comparison between NIST Graphene and AIST GaAs Quantized Hall Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927932
ER  -