TY  - JOUR
AU  - Motayed, Abhishek
AU  - Krylyuk, Sergiy
AU  - Davydov, Albert
C2  - Applied Physics Letters
DA  - 2011-09-13 00:09:00
LA  - en
M1  - 99
PB  - Applied Physics Letters
PY  - 2011
TI  - Characterization of Deep-Levels in Silicon Nanowires by Low-Frequency Noise Spectroscopy
ER  -