TY  - JOUR
AU  - Chen, Xuanxuan
AU  - Albrecht, Thomas
AU  - Delgadillo, Paulina
AU  - Dazai, Takahiro
AU  - Nealey, Paul
AU  - Kline, Regis
AU  - Sunday, Daniel
AU  - Miyagi, Ken
AU  - Maehashi, Takaya
AU  - Yamazaki, Akiyoshi
C2  - ACS Applied Materials and Interfaces
DA  - 2020-02-25 00:02:00
LA  - en
PB  - ACS Applied Materials and Interfaces
PY  - 2020
TI  - The Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928912
ER  -