TY  - GEN
AU  - Beauchamp, Carlos
AU  - Camara, Johanna
AU  - Carney, Jennifer
AU  - Choquette, Steven
AU  - Cole, Kenneth
AU  - DeRose, Paul
AU  - Duewer, David
AU  - Epstein, Michael
AU  - Kline, Margaret
AU  - Lippa, Katrice
AU  - Lucon, Enrico
AU  - Phinney, Karen
AU  - Polakoski, Maria
AU  - Possolo, Antonio
AU  - Sharpless, Katherine
AU  - Sieber, John
AU  - Toman, Blaza
AU  - Winchester, Michael
AU  - Windover, Donald
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-07-15 00:07:00
DO  - https://doi.org/10.6028/NIST.SP.260-136-2020
LA  - en
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory
ER  -