TY  - JOUR
AU  - Stoudt, Mark
AU  - Williams, Maureen
AU  - Levine, Lyle
AU  - Creuziger, Adam
AU  - Young, Sandra
AU  - Heigel, Jarred
AU  - Lane, Brandon
AU  - Phan, Thien
C2  - Integrating Materials and Manufacturing Innovation
DA  - 2020-03-03 00:03:00
LA  - en
PB  - Integrating Materials and Manufacturing Innovation
PY  - 2020
TI  - Location-specific Microstructure Characterization Within IN625 Additive Manufacturing Benchmark Test Artifacts
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928265
ER  -