TY  - JOUR
AU  - Yu, Kwang
AU  - Jarrett, Dean
AU  - Koffman, Andrew
AU  - Rigosi, Albert
AU  - Payagala, Shamith
AU  - Ryu, Kwon-Sang
AU  - Kang, Jeon-Hong
AU  - Lee, Sang-Hwa
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2020-01-03 00:01:00
LA  - en
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2020
TI  - Using a Natural Ratio to Compare DC and AC Resistances
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928594
ER  -