TY  - JOUR
AU  - Bhadauriya, Sonal
AU  - Zhang, Jianan
AU  - Lee, Jaejun
AU  - Bockstaller, Michael
AU  - Karim, Alamgir
AU  - Sheridan, Richard
AU  - Stafford, Christopher
C2  - ACS Nano
DA  - 2020-03-12 00:03:00
DO  - https://doi.org/10.1021/acsami.0c01807
LA  - en
M1  - 12
PB  - ACS Nano
PY  - 2020
TI  - Nanoscale Pattern Decay Monitored via in-situ Heated Atomic Force Microscopy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929120
ER  -