TY  - CHAP
AU  - Newbury, Dale
AU  - Scott, J
AU  - Wight, Scott
AU  - Armstrong, J
AU  - Small, John
C2  - Handbook of Microscopy for Nanotechnology, Springer Science, New York, NY
DA  - 2005-03-21
LA  - en
PB  - Handbook of Microscopy for Nanotechnology, Springer Science, New York, NY
PY  - 2005
TI  - High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
ER  -