TY  - JOUR
AU  - Windt, D
AU  - Waskiewicz, W
AU  - Kubiak, G
AU  - Barbee, T
C2  - X-Ray/EUV Optics for Astronomy Microscopy Polarimetry and Projection Lithography
DA  - 1991-01-01 00:01:00
LA  - en
PB  - X-Ray/EUV Optics for Astronomy Microscopy Polarimetry and Projection Lithography
PY  - 1991
TI  - XUV Characterization Comparison of Mo/Si Multilayer Coating,
ER  -