TY  - CHAP
AU  - Oates, Anthony
AU  - Cheung, Kin
C2  - CHALLENGES IN NANOELECTRONICS, Wiley, Hoboken, NJ
DA  - 2017-06-01 00:06:00
LA  - en
PB  - CHALLENGES IN NANOELECTRONICS, Wiley, Hoboken, NJ
PY  - 2017
TI  - Reliability of Nano-Electronic Devices
ER  -