TY  - JOUR
AU  - Chidambaram, Thenappan
AU  - Veksler, Dmitry
AU  - Madisetti, S
AU  - Yakimov, Michael
AU  - Tokranov, Vadim
AU  - Oktyabrskiy, Serge
C2  - IEEE Electron Device Letters
DA  - 2016-12-12 00:12:00
LA  - en
PB  - IEEE Electron Device Letters
PY  - 2016
TI  - InGaAs Inversion Layer Mobility and Interface Trap Density from Gated Hall Measurements
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921462
ER  -