TY  - GEN
AU  - Lang, Brian
AU  - Urbas, Aaron
AU  - DeRose, Paul
AU  - Liu, Hung-Kung
AU  - Travis, John
AU  - Choquette, Steven
AU  - Cole, Kenneth
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2017-07-10 00:07:00
DO  - https://doi.org/10.6028/jres.122.033
LA  - en
M1  - 122
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2017
TI  - Development of NIST Standard Reference Material 2082, a Pathlength Standard for Measurements in the Ultraviolet Spectrum
ER  -