TY  - JOUR
AU  - Nminibapiel, David
AU  - Veksler, Dmitry
AU  - Shrestha, Pragya
AU  - Campbell, Jason
AU  - Ryan, Jason
AU  - Baumgart, Helmut
AU  - Cheung, Kin
C2  - IEEE Electron Device Letters
DA  - 2017-05-22 00:05:00
LA  - en
PB  - IEEE Electron Device Letters
PY  - 2017
TI  - Impact of RRAM Read Fluctuations on the Program-Verify Approach
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922878
ER  -