TY  - JOUR
AU  - Smets, Quentin
AU  - Verhulst, Anne
AU  - Simoen, Eddy
AU  - Gundlach, David
AU  - Richter, Curt
AU  - Collaert, Nadine
AU  - Heyns, Marc
C2  - IEEE Electron Device Letters
DA  - 2017-09-01 00:09:00
DO  - https://doi.org/10.1109/TED.2017.2724144
LA  - en
M1  - 64
PB  - IEEE Electron Device Letters
PY  - 2017
TI  - Calibration and impact of bulk trap-assisted tunneling and Shockley-Read-Hall currents in InGaAs tunnel-FETs
ER  -