TY  - CONF
AU  - Vilkomir, Sergiy
AU  - Alluri, Aparna
AU  - Kuhn, D.
AU  - Kacker, Raghu
C2  - IEEE International Conference on Software Quality Reliability and Security, Prague, CZ
DA  - 2017-08-18 00:08:00
DO  - https://doi.org/10.1109/QRS-C.2017.19
LA  - en
PB  - IEEE International Conference on Software Quality Reliability and Security, Prague, CZ
PY  - 2017
TI  - Combinatorial and MC/DC Coverage Levels of Random Testing
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921959
ER  -