TY  - GEN
AU  - Kim, Jae
AU  - Mulholland, George
AU  - Kukuck, S
AU  - Pui, D
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2005-03-01 00:03:00
LA  - en
M1  - 110 No. 1
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2005
TI  - Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobillity Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=861332
ER  -