TY  - JOUR
AU  - Kim, Jae
AU  - Chiang, Martin
AU  - Kawaguchi, D
AU  - Eidelman, Naomi
AU  - Stafford, Christopher
AU  - Moon, Chang
C2  - Journal of Physics D-Applied Physics
DA  - 2010-12-22 00:12:00
LA  - en
M1  - 44
PB  - Journal of Physics D-Applied Physics
PY  - 2010
TI  - Combinatorial Library Designs for Quantifying Thin Film Adhesion via the Edge Delamination Test
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852688
ER  -