TY  - JOUR
AU  - Chiang, Martin
AU  - Wu, Wen-Li
AU  - He, J
AU  - Amis, Eric
C2  - Thin Solid Films
DA  - 2003-08-01 00:08:00
LA  - en
M1  - 437
PB  - Thin Solid Films
PY  - 2003
TI  - Combinatorial Approach to the Edge Delamination Test for Thin Film Reliability - Concept and Simulation
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852056
ER  -