TY  - CONF
AU  - Fasolka, Michael
AU  - Julthongpiput, D
AU  - Zhang, Wenhua
AU  - Karim, Alamgir
AU  - Amis, Eric
C2  - Pmse Preprint, Washington, DC 
DA  - 2005-01-01 00:01:00
LA  - en
PB  - Pmse Preprint, Washington, DC 
PY  - 2005
TI  - Gradient Micropatterns for Surface Nanometrology and Thin Nanomaterials Development
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853967
ER  -