TY  - CONF
AU  - Real, Mariano
AU  - Shen, Tian
AU  - Jr., George Jones
AU  - Elmquist, Randolph
AU  - Soons, Johannes
AU  - Davydov, Albert
C2  - Conference on Precision Electromagnetic Measurements 2012
, Washington, DC, US
DA  - 2012-06-01 00:06:00
LA  - en
PB  - Conference on Precision Electromagnetic Measurements 2012
, Washington, DC, US
PY  - 2012
TI  - Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
ER  -