TY  - JOUR
AU  - Real, Mariano
AU  - Lass, Eric
AU  - Liu, Fan-Hung
AU  - Shen, Tian
AU  - Jr., George Jones
AU  - Soons, Johannes
AU  - Newell, David
AU  - Davydov, Albert
AU  - Elmquist, Randolph
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2013-06-03 00:06:00
LA  - en
M1  - 62
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2013
TI  - Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=911731
ER  -