TY  - JOUR
AU  - You, Lin
AU  - Okoro, Chukwudi
AU  - Ahn, Jungjoon
AU  - Kopanski, Joseph
AU  - Obeng, Yaw
AU  - Franklin, Rhonda
C2  - ECS Journal of Solid State Science and Technology
DA  - 2014-11-07 00:11:00
DO  - https://doi.org/10.1149/2.0151501jss
LA  - en
M1  - 4
PB  - ECS Journal of Solid State Science and Technology
PY  - 2014
TI  - Broad-Band Microwave-Based Metrology Platform Development: Demonstration of In-Situ Failure Mode Diagnostic Capabilities for Integrated Circuit Reliability Analyses
ER  -