TY  - CONF
AU  - PAN, Jiangen
AU  - SHEN, Haiping
AU  - Zong, Yuqin
AU  - Ohno, Yoshi
C2  - The CIE Expert Symposium 2008 on Advances in Photometry and Colorimetry, Turin, Italy, Turin, 1, IT
DA  - 2008-10-01 00:10:00
LA  - en
M1  - CIE x033:2008
PB  - The CIE Expert Symposium 2008 on Advances in Photometry and Colorimetry, Turin, Italy, Turin, 1, IT
PY  - 2008
TI  - f1’ EVALUATION AND MEASUREMENT COMPARISON
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=842554
ER  -