TY  - CONF
AU  - Davies, Angela
AU  - Stroscio, Joseph
AU  - Pierce, Daniel
AU  - Unguris, John
AU  - Stiles, Mark
AU  - Celotta, Robert
C2  - Proceedings of the NIST Interagency Reports 5752, Gaithersburg, MD, US
DA  - 1996-01-01 00:01:00
LA  - en
PB  - Proceedings of the NIST Interagency Reports 5752, Gaithersburg, MD, US
PY  - 1996
TI  - Characterization of Metallic Thin Film Growth by STM
ER  -