TY  - CONF
AU  - Bodycomb, J
AU  - DeWitt, D
AU  - Kimes, W
AU  - Kreider, K
AU  - Tsai, Benjamin
C2  - 12th IEE Intl. Conf. on Advanced Thermal Processing RTP 2004 , Portland, OR, USA
DA  - 2004-01-01 00:01:00
LA  - en
PB  - 12th IEE Intl. Conf. on Advanced Thermal Processing RTP 2004 , Portland, OR, USA
PY  - 2004
TI  - Emissivity Compensated Pyrometry for Specular Silicon Surfaces on the NIST RTP Test Bed
ER  -