TY  - JOUR
AU  - Maranville, Brian
AU  - Mallett, J
AU  - Moffat, Thomas
AU  - McMichael, Robert
AU  - Chen, Andrew
AU  - Jr., William Egelhoff
C2  - Journal of Applied Physics
DA  - 2005-05-01 00:05:00
LA  - en
M1  - 97 No. 10
PB  - Journal of Applied Physics
PY  - 2005
TI  - Effect of Conformal Roughness on Ferromagnetic Resonance Linewidth in Thin Permalloy Films
ER  -