TY  - JOUR
AU  - Roberson, S
AU  - Sehgal, A
AU  - Fahey, Albert
AU  - Karim, Alamgir
C2  - Applied Surface Science
DA  - 2003-01-01 00:01:00
LA  - en
M1  -  203-204
PB  - Applied Surface Science
PY  - 2003
TI  - Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-SIMS) For High-Throughput Characterization Of Biosurfaces
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853847
ER  -