TY  - JOUR
AU  - Chiche, A
AU  - Zhang, Weiping
AU  - Stafford, Christopher
AU  - Karim, Alamgir
C2  - Measurement Science & Technology
DA  - 2004-12-01 00:12:00
LA  - en
M1  - 16 No. 1
PB  - Measurement Science & Technology
PY  - 2004
TI  - A New Design for High-Throughput Peel Tests: Statistical Analysis and Example
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852395
ER  -