TY  - JOUR
AU  - Huang, X
AU  - Black, David
AU  - Macrander, A
AU  - Maj, J
AU  - Chen, Yi
AU  - Dudley, M
C2  - Applied Physics Letters
DA  - 2007-12-03 00:12:00
LA  - en
M1  - 91
PB  - Applied Physics Letters
PY  - 2007
TI  - High-geometrical-resolution imaging of dislocations in SiC using monochromatic synchrotron topography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854392
ER  -