TY  - JOUR
AU  - Chen, Yi
AU  - Zhang, Ning
AU  - Dudley, M
AU  - CALDWELL, JOSHUA
AU  - Liu, Kendrick
AU  - STAHLBUSH, ROBERT
AU  - HUANG, XIANRONG
AU  - Macrander, A
AU  - Black, David
C2  - Journal of Electronic Materials
DA  - 2008-05-08 00:05:00
LA  - en
M1  - 37
PB  - Journal of Electronic Materials
PY  - 2008
TI  - Investigation of Electron Hole Recombination-Activated Partial Dislocations and Their Behavior in 4H-SiC Epitaxial Layers
ER  -