TY  - CONF
AU  - Armstrong, N
AU  - Kalceff, W
AU  - Cline, James
AU  - Bonevich, John
C2  - Analysis of Microstructure and Residual Stress by Diffraction Methods, International Conference | 3rd| Diffraction Analysis of the Microstructure of Materials | Springer, Trento, 1, IT
DA  - 2004-07-01 00:07:00
LA  - en
M1  - 68
PB  - Analysis of Microstructure and Residual Stress by Diffraction Methods, International Conference | 3rd| Diffraction Analysis of the Microstructure of Materials | Springer, Trento, 1, IT
PY  - 2004
TI  - A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material
ER  -