TY  - JOUR
AU  - Newell, David
AU  - Whitenton, Eric
AU  - Kramar, John
AU  - Pratt, Jon
AU  - Smith, Douglas
C2  - Journal of Materials Research
DA  - 2004-01-01 00:01:00
LA  - en
M1  - 19(1)
PB  - Journal of Materials Research
PY  - 2004
TI  - Progress Towards SI Traceable Force Metrology for Nanomechanics
ER  -