TY  - CONF
AU  - Song, Jun-Feng
AU  - Evans, Christopher
AU  - McGlauflin, Michael
AU  - Whitenton, Eric
AU  - Vorburger, Theodore
AU  - Yuan, Y
C2  - SPIE Electronic Imaging Conference, Scattering and Surface Roughness II, Zu-Han Gu, Alexei A. Maradudin, Editors, San Diego, CA, USA
DA  - 1998-10-01 00:10:00
LA  - en
M1  - 3426
PB  - SPIE Electronic Imaging Conference, Scattering and Surface Roughness II, Zu-Han Gu, Alexei A. Maradudin, Editors, San Diego, CA, USA
PY  - 1998
TI  - NIST Virtual/Physical Random Profile Roughness Calibration Standards
ER  -