TY  - CONF
AU  - Grinstein, Georges
AU  - Plaisant, Catherine
AU  - Laskowski, Sharon
AU  - O'Connell, Theresa
AU  - Scholtz, Jean
AU  - Whiting, Mark
C2  - IEEE Second International Conference on Biometrics: Theory, Applications and Systems (BTAS 08), Columbus, OH, US
DA  - 2008-08-29 00:08:00
LA  - en
PB  - IEEE Second International Conference on Biometrics: Theory, Applications and Systems (BTAS 08), Columbus, OH, US
PY  - 2008
TI  - VAST 2008 Challenge: Introducing Mini-Challenges
ER  -