TY  - CONF
AU  - Zhang, Fan
AU  - Cheung, Kin
AU  - Campbell, Jason
AU  - Suehle, John
C2  - IEEE International Reliability Physics Symposium Proceedings, Anaheim, CA, US
DA  - 2010-05-01 00:05:00
LA  - en
PB  - IEEE International Reliability Physics Symposium Proceedings, Anaheim, CA, US
PY  - 2010
TI  - Frequency-Dependent Charge-Pumping: The Depth Question Revisited
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904997
ER  -