TY  - CONF
AU  - Reichl, John
AU  - Berning, David
AU  - Jr., Allen Hefner
AU  - Lai, Jih-Sheng
C2  - Proceedings of the 2004 IEEE Applied Power Electronics Conference, , US
DA  - 2004-02-02 00:02:00
LA  - en
PB  - Proceedings of the 2004 IEEE Applied Power Electronics Conference, , US
PY  - 2004
TI  - Six-Pack IGBT Dynamic Electro-Thermal Model; Parameter Extraction and Validation
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906352
ER  -