TY  - CONF
AU  - Kopanski, Joseph
AU  - Afridi, Muhammad
AU  - Jeliazkov, Stoyan
AU  - Jiang, Weirong
AU  - Walker, Thomas
C2  - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
DA  - 2007-09-30 00:09:00
LA  - en
PB  - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
PY  - 2007
TI  - Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32648
ER  -