TY  - CONF
AU  - Ryan, J.T.
AU  - Lenahan, Patrick
AU  - Krishnan, A.T.
AU  - Krishnan, S.
AU  - Campbell, Jason
C2  - 2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe, NV, US
DA  - 2009-01-05 00:01:00
LA  - en
PB  - 2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe, NV, US
PY  - 2009
TI  - An Electrically-Detected Magnetic Resonance Study of the Atomic-Scale Effects of Fluorine on the Negative Bias Temperature Instability
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=900189
ER  -