TY  - JOUR
AU  - Pratt, Jon
AU  - Kramar, John
AU  - Shaw, Gordon
AU  - Gates, Richard
AU  - Rice, Paul
AU  - Moreland, John
C2  - IEEE Transactions on Nanotechnology
DA  - 2006-07-01 00:07:00
LA  - en
M1  - 1
PB  - IEEE Transactions on Nanotechnology
PY  - 2006
TI  - New reference standards and artifacts for nanoscale physical property characterization
ER  -