TY  - JOUR
AU  - Kim, K
AU  - Simons, David
AU  - Gillen, J
C2  - Applied Surface Science
DA  - 2007-01-01 00:01:00
LA  - en
PB  - Applied Surface Science
PY  - 2007
TI  - Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt-Co Alloy Multilayer by SIMS Using a Buckministerfullerene (C<sub>60</sub>)
ER  -