TY  - JOUR
AU  - Nguyen, Nhan
AU  - Pellegrino, Joseph
AU  - Amirtharaj, Paul
AU  - Seiler, David
AU  - Qadri, S.
C2  - Journal of Applied Physics
DA  - 1993-06-01 00:06:00
LA  - en
M1  - 73
PB  - Journal of Applied Physics
PY  - 1993
TI  - Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
ER  -