TY  - JOUR
AU  - Kopanski, Joseph
AU  - Albers, John
AU  - Carver, G.
AU  - Ehrstein, James
C2  - Journal of the Electrochemical Society
DA  - 1990-12-01 00:12:00
LA  - en
M1  - 137
PB  - Journal of the Electrochemical Society
PY  - 1990
TI  - Verification of the Relation Between Two-Probe and Four-Probe Resistances as Measured on Silicon Wafers
ER  -