TY  - CONF
AU  - Cresswell, Michael
AU  - Khera, D.
AU  - Linholm, Loren
AU  - Schuster, C.
C2  - Proc., IEEE International Conference on Microelectronic Test Structures, San Diego, CA, USA
DA  - 1990-12-31 00:12:00
LA  - en
PB  - Proc., IEEE International Conference on Microelectronic Test Structures, San Diego, CA, USA
PY  - 1990
TI  - Test Structure Data Classification Using a Directed Graph Approach
ER  -