TY  - CONF
AU  - Suehle, John
AU  - Schafft, Harry
C2  - Proc., 28th Annual  Reliability Physics 1990, New Orleans, LA, USA
DA  - 1990-03-01 00:03:00
LA  - en
PB  - Proc., 28th Annual  Reliability Physics 1990, New Orleans, LA, USA
PY  - 1990
TI  - Current Density Dependence of Electromigration t<sub>50</sub> Enhancement Due to Pulsed Operation
ER  -