TY  - CONF
AU  - Suehle, John
AU  - Schafft, Harry
C2  - Proc. Intl. Reliability Physics Symposium, Phoenix, AZ, USA
DA  - 1989-12-31 00:12:00
LA  - en
PB  - Proc. Intl. Reliability Physics Symposium, Phoenix, AZ, USA
PY  - 1989
TI  - The Electromigration Damage Response Time and Implications for dc and Pulsed Characterizations
ER  -