TY  - CONF
AU  - Jr., Allen Hefner
AU  - McNutt, Ty
AU  - Berning, David
AU  - Singh, Ranbir
AU  - Akuffo, Adwoa
C2  - Proceedings of ICSREM 2003, France, 1, FR
DA  - 2003-10-05 00:10:00
LA  - en
PB  - Proceedings of ICSREM 2003, France, 1, FR
PY  - 2003
TI  - The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31552
ER  -