TY  - CONF
AU  - Jr., Allen Hefner
AU  - Berning, David
AU  - Blackburn, David
AU  - Chapuy, Christophe
AU  - Bouche, Sebastien
C2  - Proc., Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA, USA
DA  - 2001-04-01 00:04:00
LA  - en
PB  - Proc., Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA, USA
PY  - 2001
TI  - A High-Speed Thermal Imaging System for Semiconductor Device Analysis
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15525
ER  -