TY  - CONF
AU  - Richter, Curt
AU  - Hacker, Christina
AU  - Richter, Lee
AU  - Kirillov, Oleg
AU  - Vogel, Eric
C2  - Proceedings of the International Semiconductor Device Research Symposium, Bethesda, MD, USA
DA  - 2006-08-01 00:08:00
LA  - en
PB  - Proceedings of the International Semiconductor Device Research Symposium, Bethesda, MD, USA
PY  - 2006
TI  - Interface Characterization of Molecular-Monolayer/SiO2 Based Molecular Junctions
ER  -