TY  - CONF
AU  - Zhu, Xiao
AU  - Anand, Dhananjay
AU  - Hussain, Sulaiman
AU  - Li-Baboud, Ya-Shian
AU  - Moyne, James
C2  - AEC/APC Symposium XX, Salt Lake City, UT, US
DA  - 2008-10-01 00:10:00
LA  - en
PB  - AEC/APC Symposium XX, Salt Lake City, UT, US
PY  - 2008
TI  - A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33161
ER  -